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Results 1 to 25 of 129

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High power output and temperature characteristics of 1.06μm diode array moduleSHUN YAO; GETAO TAO; GUOGUANG LU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60280G.1-60280G.6, issn 0277-786X, isbn 0-8194-6059-1, 1VolConference Paper

Influence of oxygen in AlGaAs-based laser structures with Al-free active region on device propertiesKNAUER, A; WENZEL, H; ERBERT, G et al.Journal of electronic materials. 2001, Vol 30, Num 11, pp 1421-1424, issn 0361-5235Conference Paper

Beam quality of high power 800 nm broad-area laser diodes with 1 and 2 μm large optical cavity structuresHÜLSEWEDE, R; SEBASTIAN, J; WENZEL, H et al.Optics communications. 2001, Vol 192, Num 1-2, pp 69-75, issn 0030-4018Article

Determination of excitonic binding energies in symmetrically strained (GaIn)As/Ga(AsP) multiple quantum wells using quantum beat spectroscopyKOCH, M; VOLK, M; MEIER, T et al.Superlattices and microstructures. 1994, Vol 15, Num 3, pp 329-332, issn 0749-6036Article

Unequal P Distribution in Nanowires and the Planar Layer during GaAsP Growth on GaAs {111}B by Metal―Organic Chemical Vapor DepositionWEN SUN; QUO, Ya-Nan; XU, Hong-Yi et al.Journal of physical chemistry. C. 2013, Vol 117, Num 37, pp 19234-19238, issn 1932-7447, 5 p.Article

EFFET DE STABILISATION DE LA COMPOSITION DANS UNE COUCHE EPITAXIQUE DE SOLUTION SOLIDEVORONKOV VV; DOLGINOV LM; LAPSHIN AN et al.1977; KRISTALLOGRAFIJA; S.S.S.R.; DA. 1977; VOL. 22; NO 2; PP. 375-378; BIBL. 6 REF.Article

Single-photon-sensitive EBCCD with additional multiplicationSUYAMA, M; SATO, T; MURAMATSU, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 629407.1-629407.11, issn 0277-786X, isbn 0-8194-6373-6, 1VolConference Paper

Self-Catalyzed Ternary Core-Shell GaAsP Nanowire Arrays Grown on Patterned Si Substrates by Molecular Beam EpitaxyYUNYAN ZHANG; JIANG WU; AAGESEN, Martin et al.Nano letters (Print). 2014, Vol 14, Num 8, pp 4542-4547, issn 1530-6984, 6 p.Article

Effect of light-hole tunnelling on the excitonic properties of GaAsP/AlGaAs near-surface quantum wellsPAL, Suparna; SINGH, S. D; PORWAL, S et al.Semiconductor science and technology. 2013, Vol 28, Num 3, issn 0268-1242, 035016.1-035016.8Article

Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observationXIUGUANG JIN; NAKAHARA, Hirotaka; SAITOH, Koh et al.Journal of crystal growth. 2012, Vol 353, Num 1, pp 84-87, issn 0022-0248, 4 p.Article

Suppressed lattice relaxation during InGaAs/GaAsP MQW growth with InGaAs and GaAs ultra-thin interlayersFUJII, Hiromasa; YUNPENG WANG; WATANABE, Kentaroh et al.Journal of crystal growth. 2012, Vol 352, Num 1, pp 239-244, issn 0022-0248, 6 p.Conference Paper

Staggered InGaAs/GaAsP strained layer superlattices for use in optical devicesCOLTER, P. C; CARLIN, C. Z; SAMBERG, J. P et al.Physica status solidi. A, Applications and materials science (Print). 2011, Vol 208, Num 12, pp 2884-2888, issn 1862-6300, 5 p.Article

Reliability of diode lasers for space applicationsHÄUSLER, K; ZEIMER, U; SUMPF, B et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7198, issn 0277-786X, isbn 978-0-8194-7444-5 0-8194-7444-4, 1Vol, 719816.1-719816.12Conference Paper

Temperature analysis of threshold current in infrared vertical-cavity surface-emitting lasersCHEN CHEN; LEISHER, Paul O; ALLERMAN, Andrew A et al.IEEE journal of quantum electronics. 2006, Vol 42, Num 9-10, pp 1078-1083, issn 0018-9197, 6 p.Article

Device characteristics of GaAs-based heterojunction bipolar transistors using an InGaAs/GaAsP strain-compensated layer as a base materialWU, Cheng-Hsien; SU, Yan-Kuin; CHANG, Shoou-Jinn et al.Semiconductor science and technology. 2004, Vol 19, Num 7, pp 828-832, issn 0268-1242, 5 p.Article

Structural and optical properties of GaAsSb/GaAs heterostructure quantum wellsJIANG, D. S; BIAN, L. F; LIANG, X. G et al.Journal of crystal growth. 2004, Vol 268, Num 3-4, pp 336-341, issn 0022-0248, 6 p.Conference Paper

Tailoring light and heavy holes of GaAsP-AlGaAs quantum wells by using interdiffusion for polarization-independent amplifier applicationsCHOY, W. C. H.IEEE journal of quantum electronics. 2000, Vol 36, Num 2, pp 164-174, issn 0018-9197Article

Application des contraintes biaxiales à l'amélioration du transport vertical des trous dans les hétérostructures = Application of biaxial strain to the enhancement of vertical hole transport in heterostructuresLampin, Jean-François; Mollot, Francis.1997, 203 p.Thesis

Tensile strain and threshold currents in GaAsP-AlGaAs single-quantum-well lasersBALIGA, A; AGAHI, F; ANDERSON, N. G et al.IEEE journal of quantum electronics. 1996, Vol 32, Num 1, pp 29-37, issn 0018-9197Article

Analysis of current-temperature-light characteristics of GaAsP light-emitting diodesTANAKA, Y; TOYAMA, T.I.E.E.E. transactions on electron devices. 1994, Vol 41, Num 8, pp 1475-1477, issn 0018-9383Article

Strain-balanced InGaAs/GaAsP multiquantum well reflection modulator operating near 1.06 μm on GaAs and silicon substratesGOOSSEN, K. W; CUNNINGHAM, J. E; SANTOS, M. B et al.Electronics Letters. 1993, Vol 29, Num 22, pp 1985-1986, issn 0013-5194Article

Effect of GaAsP barrier layers on the parameters of InGaAs/AlGaAs laser diodes emitting in the 1050- 1100-nm spectral rangeDURAEV, V. P; MARMALYUK, A. A; PADALITSA, A. A et al.Quantum electronics (Woodbury). 2005, Vol 35, Num 10, pp 909-911, issn 1063-7818, 3 p.Article

Axial Diffusion Barriers in Near-Infrared Nanopillar LEDsSCOFIELD, Adam C; LIN, Andrew; HADDAD, Michael et al.Nano letters (Print). 2014, Vol 14, Num 11, pp 6037-6041, issn 1530-6984, 5 p.Article

Growth and testing of vertical external cavity surface emitting lasers (VECSELs) for intracavity cooling of Yb:YLFCEDERBERG, J. G; ALBRECHT, A. R; GHASEMKHANI, M et al.Journal of crystal growth. 2014, Vol 393, pp 28-31, issn 0022-0248, 4 p.Conference Paper

Characterization of Metamorphic GaAsP/Si Materials and Devices for Photovoltaic ApplicationsGRASSMAN, Tyler J; BRENNER, Mark R; GONZALEZ, Maria et al.I.E.E.E. transactions on electron devices. 2010, Vol 57, Num 12, pp 3361-3369, issn 0018-9383, 9 p.Article

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